Optimum accelerated life test sampling plans for Type-I hybrid censored Weibull distributed products sold under general rebate warranty

Chakrabarty Jimut Bahan (), Roy Soumya () and Chowdhury Shovan ()
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Chakrabarty Jimut Bahan: Indian Institute of Management Kozhikode
Roy Soumya: Indian Institute of Management Kozhikode
Chowdhury Shovan: Indian Institute of Management Kozhikode

No 349, Working papers from Indian Institute of Management Kozhikode

Abstract: In order to reduce avoidably lengthy duration required to test highly reliable products underusage stress, accelerated life test sampling plans are employed. In this paper, accelerated life test samplingplans (ALTSP) are developed for Type-I hybrid censored products sold under the general rebate warranty.The primary decision model proposed in this paper determines ALTSP by minimizing the relevant costsinvolved. The optimal solution is attained by utilizing appropriate analysis techniques following a constrainedoptimization approach. As a special case, ALTSP for Type-I censoring is obtained using the same approach.ALTSP under Type-I hybrid censoring using the variance minimization method is also derived. A well-designed sensitivity analysis is incorporated using a real-life failure dataset pertaining to low-metallic break-pads to analyze the sensitivity of the optimal solution due to the mis-specification of parameter values. Themodel is exemplified using a real-life case.

Keywords: Accelerated life tests; Sampling plans; Weibull distribution; Type-I hybrid censoring; Generalrebate warranty; Constrained optimization. (search for similar items in EconPapers)
Pages: 23 pages
Date: 2019-11
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Citations: View citations in EconPapers (1)

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