Yield, variability, reliability, and stability of two-dimensional materials based solid-state electronic devices

Mario Lanza (), Quentin Smets, Cedric Huyghebaert and Lain-Jong Li
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Mario Lanza: King Abdullah University of Science and Technology (KAUST)
Quentin Smets: IMEC
Cedric Huyghebaert: IMEC
Lain-Jong Li: King Abdullah University of Science and Technology (KAUST)

Nature Communications, 2020, vol. 11, issue 1, 1-5

Abstract: The importance of statistical analyses on 2D materials-based electronic devices and circuits is sometimes overlooked. Here the authors discuss the most pressing integration issues for such devices and emphasize the need for yield, variability, reliability, and stability benchmarking, and outline viable strategies resulting in research papers that are useful for the industry.

Date: 2020
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DOI: 10.1038/s41467-020-19053-9

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