A testing-coverage software reliability model considering fault removal efficiency and error generation

Qiuying Li and Hoang Pham

PLOS ONE, 2017, vol. 12, issue 7, 1-25

Abstract: In this paper, we propose a software reliability model that considers not only error generation but also fault removal efficiency combined with testing coverage information based on a nonhomogeneous Poisson process (NHPP). During the past four decades, many software reliability growth models (SRGMs) based on NHPP have been proposed to estimate the software reliability measures, most of which have the same following agreements: 1) it is a common phenomenon that during the testing phase, the fault detection rate always changes; 2) as a result of imperfect debugging, fault removal has been related to a fault re-introduction rate. But there are few SRGMs in the literature that differentiate between fault detection and fault removal, i.e. they seldom consider the imperfect fault removal efficiency. But in practical software developing process, fault removal efficiency cannot always be perfect, i.e. the failures detected might not be removed completely and the original faults might still exist and new faults might be introduced meanwhile, which is referred to as imperfect debugging phenomenon. In this study, a model aiming to incorporate fault introduction rate, fault removal efficiency and testing coverage into software reliability evaluation is developed, using testing coverage to express the fault detection rate and using fault removal efficiency to consider the fault repair. We compare the performance of the proposed model with several existing NHPP SRGMs using three sets of real failure data based on five criteria. The results exhibit that the model can give a better fitting and predictive performance.

Date: 2017
References: View complete reference list from CitEc
Citations: View citations in EconPapers (6)

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Persistent link: https://EconPapers.repec.org/RePEc:plo:pone00:0181524

DOI: 10.1371/journal.pone.0181524

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