Planning, tracking and projecting method for testability growth based on in time correction

Chenxu Zhao, Jing Qiu, Guanjun Liu and Kehong Lv

Journal of Risk and Reliability, 2016, vol. 230, issue 2, 228-236

Abstract: A practical mathematic model for in time correction–based testability growth test is proposed in this article. This model can make up the gap between the testability growth test practice and theory. The process of testability design defects identification and correction is formulated, based on which the testability growth test plan optimization method is given with the minimum test cost criterion. A Bayes approach is studied to track the testability growth from the test data. Then the tracked results are used to learn the system correction skill and to project the subsequent testability growth test. Simulation results show that the models and methods presented in this paper are reasonable and can efficiently manage the in time correction–based testability growth test planning, tracking, and projecting problem.

Keywords: Testability; growth test; in time correction; test management; decision making (search for similar items in EconPapers)
Date: 2016
References: View references in EconPapers View complete reference list from CitEc
Citations:

Downloads: (external link)
https://journals.sagepub.com/doi/10.1177/1748006X15626026 (text/html)

Related works:
This item may be available elsewhere in EconPapers: Search for items with the same title.

Export reference: BibTeX RIS (EndNote, ProCite, RefMan) HTML/Text

Persistent link: https://EconPapers.repec.org/RePEc:sae:risrel:v:230:y:2016:i:2:p:228-236

DOI: 10.1177/1748006X15626026

Access Statistics for this article

More articles in Journal of Risk and Reliability
Bibliographic data for series maintained by SAGE Publications ().