Signature reliability analysis of complex consecutive k-out-of-n:W CMO system via UGF and SFA

Sadiya Naaz, Rashmi Khanna, Riya Rawat, Neha Negi, Mangey Ram, Akshay Kumar and Anuj Kumar

Journal of Risk and Reliability, 2024, vol. 238, issue 5, 1037-1052

Abstract: Microwaves are an example of “electromagnetic†radiation, which is a combination of electromagnetic and electrical waves traveling through space. In this paper, the complex consecutive k -out-of- n:W (where, W stands for working system) convection microwave oven system (CMOS) is proposed and different measures are calculated on the basis of the reliability function via two techniques namely, universal generating function (u-function/UGF) and structure-function approach (SFA). Basically, the main aim of the study is to evaluate the signature reliability analysis of the complex consecutive k -out-of- n:W CMOS system using proposed techniques. To assess the suggested system’s reliability function and related metrics, both methods are applied. The considered system consisted of a total seven components, but the system comprises the k -out-of- n:W robustness strategy that’s why it becomes a complex consecutive 5-out-of-7: W CMOS. With the help of the reliability function, the minimal signature is introduced for the determination of the anticipated lifetime and its cost rate. Also. the purpose of this work is to evaluate all these outcomes and then compare their values, which are yielded by both applied approaches, that is, u-function approach and SFA.

Keywords: Cumulative signature; signature reliability; reliability function; u-function; SFA; complex systems; consecutive k-out-of-n:W system; expected lifetime; expected cost rate (search for similar items in EconPapers)
Date: 2024
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Persistent link: https://EconPapers.repec.org/RePEc:sae:risrel:v:238:y:2024:i:5:p:1037-1052

DOI: 10.1177/1748006X231193193

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