A new approach for reliability assessment of the smart microgrids using k-shortest path algorithms

Mohammadreza Gholami, Meysam Mohammadtaheri and Alireza Gholami

Journal of Risk and Reliability, 2025, vol. 239, issue 1, 122-135

Abstract: Graphical table of contents

Keywords: Cyber physical microgrids; dynamic thermal rating (DTR) system; expected energy not supplied (EENS); k shortest path algorithm; loss of load probability (LOLP); most probable configurations; reliability assessment; smart microgrids (search for similar items in EconPapers)
Date: 2025
References: Add references at CitEc
Citations:

Downloads: (external link)
https://journals.sagepub.com/doi/10.1177/1748006X231214337 (text/html)

Related works:
This item may be available elsewhere in EconPapers: Search for items with the same title.

Export reference: BibTeX RIS (EndNote, ProCite, RefMan) HTML/Text

Persistent link: https://EconPapers.repec.org/RePEc:sae:risrel:v:239:y:2025:i:1:p:122-135

DOI: 10.1177/1748006X231214337

More articles in Journal of Risk and Reliability
Bibliographic data for series maintained by SAGE Publications ().