An ellipsometric investigation of Ag/SiO $\mathsf{_2}$ nanocomposite thin films

R. Roy, S. Mandal, D. Bhattacharyya and A. Pal ()

The European Physical Journal B: Condensed Matter and Complex Systems, 2003, vol. 34, issue 1, 25-31

Abstract: Dielectric properties of silver/SiO 2 nanocomposite thin films grown by high-pressure d.c. sputtering technique were studied by spectroscopic ellipsometry (300-800 nm). The dielectric behavior of the nanocomposite thin films largely depended on the particle size, its number density and the surrounding environments. The films showed semiconductor-like behavior up to a critical particle size and concentration, beyond which the films exhibited the typical surface plasmon resonance characteristics in their optical properties. The refractive index was also found to have a strong dependence on the particle size and its dispersion in the matrix. The results were found to be consistent with those obtained from UV-VIS optical absorbance data. Bruggeman effective medium theory was used to explain the experimental results. Copyright Springer-Verlag Berlin/Heidelberg 2003

Date: 2003
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DOI: 10.1140/epjb/e2003-00192-5

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