Josephson current through a ferromagnetic semiconductor/semiconductor/ferromagnetic semiconductor structure

Y. C. Tao ()

The European Physical Journal B: Condensed Matter and Complex Systems, 2007, vol. 56, issue 2, 83-91

Abstract: We theoretically calculate the Josephson current for two superconductor/ferromagnetic semiconductor (SC/FS) bilayers separated by a semiconductor (SM) layer. It is found that the critical Josephson current I C in the junction is strongly determined by not only the relative orientations of the effective exchange field ${\bf h}$ of the two bilayers and scattering potential strengths at the interfaces but also the kinds of holes (the heavy or light) in the two FS layers. Furthermore, a robust approach to measuring the spin polarization P for the heavy and light holes is presented. Copyright EDP Sciences/Società Italiana di Fisica/Springer-Verlag 2007

Keywords: 74.50.+r Tunneling phenomena; point contacts, weak links, Josephson effects, 74.45.+c Proximity effects; Andreev effect; SN and SNS junctions, 75.50.Pp Magnetic semiconductors, (search for similar items in EconPapers)
Date: 2007
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DOI: 10.1140/epjb/e2007-00094-6

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