Chemical states of GeTe thin-film during structural phase-change by annealing in ultra-high vacuum

C. Ko, Y. M. Lee, H. J. Shin, M.-C. Jung (), M. Han, K. Kim, J. C. Park, S. A. Song and H. S. Jeong

The European Physical Journal B: Condensed Matter and Complex Systems, 2008, vol. 66, issue 2, 171-174

Keywords: 81.05.Gc Amorphous semiconductors; 79.60.Bm Clean metal; semiconductor; and insulator surfaces; 82.80.Pv Electron spectroscopy (X-ray photoelectron (XPS); Auger electron spectroscopy (AES); etc.) (search for similar items in EconPapers)
Date: 2008
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DOI: 10.1140/epjb/e2008-00400-x

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