Correction: Data-driven aggregate modeling of a semiconductor wafer fab to predict WIP levels and cycle time distributions

Patrick C. Deenen (), Jeroen Middelhuis (), Alp Akcay () and Ivo J. B. F. Adan ()
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Patrick C. Deenen: Eindhoven University of Technology
Jeroen Middelhuis: Eindhoven University of Technology
Alp Akcay: Eindhoven University of Technology
Ivo J. B. F. Adan: Eindhoven University of Technology

Flexible Services and Manufacturing Journal, 2024, vol. 36, issue 2, No 8, 597-598

Date: 2024
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DOI: 10.1007/s10696-023-09504-y

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