Estimation of stress-strength reliability for type-1 pathway generated exponential distribution

V. Gladwin James (), Sudheep Jose (), Thomas Xavier () and Nicy Sebastian ()
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V. Gladwin James: St. Thomas College (Autonomous), University of Calicut
Sudheep Jose: St. Stephen′s College
Thomas Xavier: Novartis Healthcare Private Limited
Nicy Sebastian: St. Thomas College (Autonomous), University of Calicut

International Journal of System Assurance Engineering and Management, 2025, vol. 16, issue 8, No 14, 2858-2869

Abstract: Abstract The pathway model provides a versatile framework for generating flexible distribution families, with the type-1 pathway generated exponential model emerging as a special case. This distribution accommodates diverse hazard behaviors including constant, increasing, decreasing, bathtub, and unimodal shapes enabling it to capture complex real world failure rate trends, such as those observed in survival and reliability data. We derive its key statistical properties; survival and hazard functions, moments and likelihood ratio ordering. The stress-strength reliability is developed and its maximum likelihood estimate and asymptotic confidence interval is constructed. An extensive Monte Carlo simulation validates the precision and stability of these methods, while an application to AIDS blood transfusion data demonstrates their practical utility in modeling real life dataset.

Keywords: Hazard functions; Stress-strength reliability; Maximum likelihood estimation; Monte Carlo simulation; AIDS blood transfusion data (search for similar items in EconPapers)
Date: 2025
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DOI: 10.1007/s13198-025-02845-x

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