Probabilistic Coverage

Weili Wu, Zhao Zhang, Wonjun Lee and Ding-Zhu Du
Additional contact information
Weili Wu: University of Texas at Dallas
Zhao Zhang: Zhejiang Normal University
Wonjun Lee: Korea University
Ding-Zhu Du: University of Texas at Dallas

Chapter Chapter 13 in Optimal Coverage in Wireless Sensor Networks, 2020, pp 203-207 from Springer

Abstract: Abstract Previously, we consider that the state of a sensor covering targets is in binary mode: success (cover the targets) or fail (cannot cover the targets). However in the real world, a sensor covers targets with a certain probability, called the Probabilistic coverage, due to various issues which cause the uncertainty and form various probabilistic models, including the probabilistic network model, the probabilistic sensing model, the random noise model, the random fault model, etc. About probabilistic coverage, there is a quite long survey. Here, we introduce this subject briefly. The reader may refer the survey if would like to study more.

Date: 2020
References: Add references at CitEc
Citations:

There are no downloads for this item, see the EconPapers FAQ for hints about obtaining it.

Related works:
This item may be available elsewhere in EconPapers: Search for items with the same title.

Export reference: BibTeX RIS (EndNote, ProCite, RefMan) HTML/Text

Persistent link: https://EconPapers.repec.org/RePEc:spr:spochp:978-3-030-52824-9_13

Ordering information: This item can be ordered from
http://www.springer.com/9783030528249

DOI: 10.1007/978-3-030-52824-9_13

Access Statistics for this chapter

More chapters in Springer Optimization and Its Applications from Springer
Bibliographic data for series maintained by Sonal Shukla () and Springer Nature Abstracting and Indexing ().