Integral Equation Modeling of Electrostatic Interactions in Atomic Force Microscopy

Y. Shen (), D.M. Barnett () and P.M. Pinsky ()
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Y. Shen: Stanford University
D.M. Barnett: Stanford University
P.M. Pinsky: Stanford University

Chapter 27 in Integral Methods in Science and Engineering, 2008, pp 237-246 from Springer

Keywords: Atomic Force Microscope Image; Boundary Element Method; Boundary Integral Equation; Surface Charge Density; Conductive Sample (search for similar items in EconPapers)
Date: 2008
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DOI: 10.1007/978-0-8176-4671-4_27

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