Burn-in at the Component and System Level

Henry W. Block, Jie Mi and Thomas H. Savits
Additional contact information
Henry W. Block: University of Pittsburgh, Department of Mathematics and Statistics
Jie Mi: Florida International University, Department of Statistics
Thomas H. Savits: University of Pittsburgh, Department of Mathematics and Statistics

A chapter in Lifetime Data: Models in Reliability and Survival Analysis, 1996, pp 53-57 from Springer

Abstract: Abstract A variety of engineering systems are assembled from components which have been “burned-in.” That is, the components have been tested, possibly under accelerated stresses, to remove weak items. Components surviving this test period are said to have been burned-in. Often this burn-in procedure is applied to systems. Under certain standard assumptions and various criteria, it is shown that a system burn-in is unnecessary, i.e., effective component burn-in precludes system burn-in.

Keywords: Optimal Choice; Residual Life; Mission Time; Weak Item; Residual Life Function (search for similar items in EconPapers)
Date: 1996
References: Add references at CitEc
Citations:

There are no downloads for this item, see the EconPapers FAQ for hints about obtaining it.

Related works:
This item may be available elsewhere in EconPapers: Search for items with the same title.

Export reference: BibTeX RIS (EndNote, ProCite, RefMan) HTML/Text

Persistent link: https://EconPapers.repec.org/RePEc:spr:sprchp:978-1-4757-5654-8_8

Ordering information: This item can be ordered from
http://www.springer.com/9781475756548

DOI: 10.1007/978-1-4757-5654-8_8

Access Statistics for this chapter

More chapters in Springer Books from Springer
Bibliographic data for series maintained by Sonal Shukla () and Springer Nature Abstracting and Indexing ().