Joint Denoising and Line Distortion Correction for Raster-Scanned Image Series

Benjamin Berkels () and Peter Binev ()
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Benjamin Berkels: RWTH Aachen University, Aachen Institute for Advanced Study in Computational Engineering Science (AICES)
Peter Binev: University of South Carolina

A chapter in Multiscale, Nonlinear and Adaptive Approximation II, 2024, pp 99-114 from Springer

Abstract: Abstract The problem of noise in a general data acquisition procedure can be resolved more accurately if it is based on a model that describes well the distortions of the data including both spatial and intensity changes. The focus of this article is the modeling of the position distortions during sequential data acquisitions. A guiding example is the data obtained by Scanning Transmission Electron Microscopy (STEM) and High Angular Annular Dark Field (HAADF) data, in particular. The article discusses different models of the position noise and their numerical implementations comparing some computational results.

Date: 2024
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Persistent link: https://EconPapers.repec.org/RePEc:spr:sprchp:978-3-031-75802-7_6

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DOI: 10.1007/978-3-031-75802-7_6

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