Identification of Conductivity Distribution in a Au-Al Junction for Application to Integrated Circuits

Alessandro Bramanti, Paolo Di Barba (), Antonio Savini, Umberto Anselmi Tamburini and Filippo Maglia
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Alessandro Bramanti: University of Pavia, Department of Electrical Engineering
Paolo Di Barba: University of Pavia, Department of Electrical Engineering
Antonio Savini: University of Pavia, Department of Electrical Engineering
Umberto Anselmi Tamburini: University of Pavia, Department of Physical Chemistry
Filippo Maglia: University of Pavia, Department of Physical Chemistry

A chapter in Optimization and Inverse Problems in Electromagnetism, 2003, pp 223-231 from Springer

Abstract: Abstract The junction between Au and Al in a current-carrying contact for application to integrated circuits is considered. The conductivity of the compound is identified by means of a field-inversion technique. The simulation of the growth process of the Au-Al compound relies on the transient field analysis of the current flow through the junction. Results of the identification are compared with measurements.

Keywords: integrated circuits; two-metal junction; conductivity identification. (search for similar items in EconPapers)
Date: 2003
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Persistent link: https://EconPapers.repec.org/RePEc:spr:sprchp:978-94-017-2494-4_22

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DOI: 10.1007/978-94-017-2494-4_22

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