Which-Is-Better (WIB): Problems in Reliability Theory

Satoshi Mizutani (), Xufeng Zhao () and Toshio Nakagawa ()
Additional contact information
Satoshi Mizutani: Aichi Institute of Technology
Xufeng Zhao: Nanjing University of Aeronautics and Astronautics
Toshio Nakagawa: Aichi Institute of Technology

in Springer Series in Reliability Engineering from Springer, currently edited by Hoang Pham

Date: 2023
ISBN: 978-3-031-27316-2
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Chapters in this book:

Ch Chapter 1 Introduction

Satoshi Mizutani, Xufeng Zhao and Toshio Nakagawa

Ch Chapter 2 Random Age Replacement Model

Satoshi Mizutani, Xufeng Zhao and Toshio Nakagawa

Ch Chapter 3 Replacement Model with Minimal Repair

Satoshi Mizutani, Xufeng Zhao and Toshio Nakagawa

Ch Chapter 4 Periodic Replacement Models

Satoshi Mizutani, Xufeng Zhao and Toshio Nakagawa

Ch Chapter 5 Extended Replacement Models

Satoshi Mizutani, Xufeng Zhao and Toshio Nakagawa

Ch Chapter 6 Which is Better for Standby or Parallel Systems

Satoshi Mizutani, Xufeng Zhao and Toshio Nakagawa

Ch Chapter 7 Which is Better Problems in Shock and Damage Models

Satoshi Mizutani, Xufeng Zhao and Toshio Nakagawa

Ch Chapter 8 Which is Better Problems in Backup Models

Satoshi Mizutani, Xufeng Zhao and Toshio Nakagawa

Ch Chapter 9 Which is Better Problems in Checkpoint Models

Satoshi Mizutani, Xufeng Zhao and Toshio Nakagawa

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DOI: 10.1007/978-3-031-27316-2

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