Recent models in data envelopment analysis: Theory and applications

Jati K. Sengupta

Applied Stochastic Models and Data Analysis, 1996, vol. 12, issue 1, 1-26

Abstract: A critical review of the recent models of data envelopment analysis (DEA) is attempted here. Three new lines of approach involving dynamic changes in parameters, the error correction models and a stochastic sensitivity analysis are discussed in some detail. On the applications side, two new formulations are presented and discussed, e.g. a model of technical change and a cost frontier for testing economies of scale and adjustment due to risk factors. Thus the critical review of recent DEA models of productivity measurement provides new insight into the frontier of research in this field.

Date: 1996
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https://doi.org/10.1002/(SICI)1099-0747(199603)12:13.0.CO;2-Y

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Persistent link: https://EconPapers.repec.org/RePEc:wly:apsmda:v:12:y:1996:i:1:p:1-26

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