Discrete software reliability growth models

Shioeru Yamada and Shunji Osaki

Applied Stochastic Models and Data Analysis, 1985, vol. 1, issue 1, 65-77

Abstract: A general description of a discrete software reliability growth model, which adopts the number of test runs or the number of executed test cases as the unit of error detection period, is presented. Two classes of discrete software reliability growth models are proposed and discussed. These models can be described by non‐homogeneous Poisson processes, in which the random variable is denned as the number of errors detected by n test runs (n = 0, 1, 2,…). The application and comparison of these models to actual software error data are shown.

Date: 1985
References: View complete reference list from CitEc
Citations:

Downloads: (external link)
https://doi.org/10.1002/asm.3150010108

Related works:
This item may be available elsewhere in EconPapers: Search for items with the same title.

Export reference: BibTeX RIS (EndNote, ProCite, RefMan) HTML/Text

Persistent link: https://EconPapers.repec.org/RePEc:wly:apsmda:v:1:y:1985:i:1:p:65-77

Access Statistics for this article

More articles in Applied Stochastic Models and Data Analysis from John Wiley & Sons
Bibliographic data for series maintained by Wiley Content Delivery ().