Exploratory data analysis for planar tessellations: Structural analysis and point process methods

D. Stoyan and H. Stoyan

Applied Stochastic Models and Data Analysis, 1990, vol. 6, issue 1, 13-25

Abstract: This paper presents methods for the exploratory analysis of particular geometrical data, namely planar tessellations. At first, two non‐stochastic methods are suggested which may help to classify tessellations and to understand their structure. The first one consists of approximating a given tessellation by a Dirichlet tessellation. The other one uses the nodes of a given tessellation and tests the possibility of reconstructing it by a fixed rule of connecting nodes by edges. Furthermore, in order to obtain information on the spatial behaviour of a tessellation, we suggest the use of the methods of point process statistics. In particular, pair correlation and mark correlation functions describe spatial correlations in tessellations.

Date: 1990
References: View complete reference list from CitEc
Citations:

Downloads: (external link)
https://doi.org/10.1002/asm.3150060103

Related works:
This item may be available elsewhere in EconPapers: Search for items with the same title.

Export reference: BibTeX RIS (EndNote, ProCite, RefMan) HTML/Text

Persistent link: https://EconPapers.repec.org/RePEc:wly:apsmda:v:6:y:1990:i:1:p:13-25

Access Statistics for this article

More articles in Applied Stochastic Models and Data Analysis from John Wiley & Sons
Bibliographic data for series maintained by Wiley Content Delivery ().