Global planning of accelerated degradation tests based on exponential dispersion degradation models

I‐Chen Lee, Sheng‐Tsaing Tseng and Yili Hong

Naval Research Logistics (NRL), 2020, vol. 67, issue 6, 469-483

Abstract: The accelerated degradation test (ADT) is an efficient tool for assessing the lifetime information of highly reliable products. However, conducting an ADT is very expensive. Therefore, how to conduct a cost‐constrained ADT plan is a great challenging issue for reliability analysts. By taking the experimental cost into consideration, this paper proposes a semi‐analytical procedure to determine the total sample size, testing stress levels, the measurement frequencies, and the number of measurements (within a degradation path) globally under a class of exponential dispersion degradation models. The proposed method is also extended to determine the global planning of a three‐level compromise plan. The advantage of the proposed method not only provides better design insights for conducting an ADT plan, but also provides an efficient algorithm to obtain a cost‐constrained ADT plan, compared with conventional optimal plans by grid search algorithms.

Date: 2020
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https://doi.org/10.1002/nav.21923

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Persistent link: https://EconPapers.repec.org/RePEc:wly:navres:v:67:y:2020:i:6:p:469-483

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