FORMATION AND MICROSTRUCTURE OF (105)-ORIENTED EPITAXIAL THIN FILMS OFYBa2Cu3O7-δ

Y. Yang, J. Gao and T. C. Chui
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Y. Yang: Department of Physics, The University of Hong Kong, Pokfulam Road, Hong Kong, P.R.China
J. Gao: Department of Physics, The University of Hong Kong, Pokfulam Road, Hong Kong, P.R.China
T. C. Chui: Department of Physics, The University of Hong Kong, Pokfulam Road, Hong Kong, P.R.China

Surface Review and Letters (SRL), 1997, vol. 04, issue 04, 679-685

Abstract: The formation and microstructure of theYBa2Cu3O7-δthin films grown on (305)SrTiO3substrates have been studied by means of transmission electron microscopy, X-ray diffraction analysis and scanning electron microscopy.YBa2Cu3O7-δwas epitaxially grown on the stepped surface of such tilted substrates with an angle of 31° between itscaxis and the substrate surface normal, forming the (105)-oriented films. A common feature of this kind of films is that small antidomains are nucleated in the initial growing stage. However, the further growth of these antidomains is depressed by the growth ofYBa2Cu3O7-δwith the desired orientation, leading to the formation of a single domain film. The surface of the (105)YBa2Cu3O7-δfilms is significantly rougher than that ofcaxis films but smoother than that of some other tilted films. Strong anisotropy of the transport properties has also been found in the [010] and$[50\bar 1]$directions of the (105)YBa2Cu3O7-δfilms.

Date: 1997
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DOI: 10.1142/S0218625X97000675

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