The Influence of Surface Orientation and Sample Thickness on the Substitutional Bulk Diffusion Coefficient in Thin Samples
J. Du Plessis,
S. P. Russo,
J. Hoadley and
E. C. Mortimer
Additional contact information
J. Du Plessis: Department of Applied Physics, Royal Melbourne Institute of Technology University, Melbourne 3001, Australia
S. P. Russo: Department of Applied Physics, Royal Melbourne Institute of Technology University, Melbourne 3001, Australia
J. Hoadley: Department of Applied Physics, Royal Melbourne Institute of Technology University, Melbourne 3001, Australia
E. C. Mortimer: Materials Research Group, iThemba Laboratories, PO Box 722, Somerset West, ZA-7129, Republic of South Africa
Surface Review and Letters (SRL), 2003, vol. 10, issue 02n03, 241-246
Abstract:
Model calculations are presented to show that for thin samples the vacancy formation energy is determined by the concentration of vacancies in the bulk. The equilibrium vacancy concentration is calculated and its effect on the substitutional bulk diffusion coefficient is discussed. It is shown that the diffusion coefficientDexhibits abrupt transitions as a function of temperature but that these transitions occur at temperatures which are independent of the surface orientation. The effects are confined to thin samples and for thicker samples the model predicts the well-established bulk diffusion values independent of surface properties.
Date: 2003
References: View complete reference list from CitEc
Citations:
Downloads: (external link)
http://www.worldscientific.com/doi/abs/10.1142/S0218625X03005037
Access to full text is restricted to subscribers
Related works:
This item may be available elsewhere in EconPapers: Search for items with the same title.
Export reference: BibTeX
RIS (EndNote, ProCite, RefMan)
HTML/Text
Persistent link: https://EconPapers.repec.org/RePEc:wsi:srlxxx:v:10:y:2003:i:02n03:n:s0218625x03005037
Ordering information: This journal article can be ordered from
DOI: 10.1142/S0218625X03005037
Access Statistics for this article
Surface Review and Letters (SRL) is currently edited by S Y Tong
More articles in Surface Review and Letters (SRL) from World Scientific Publishing Co. Pte. Ltd.
Bibliographic data for series maintained by Tai Tone Lim ().