Focusing Elements and Design Considerations for a Scanning Helium Microscope (SHeM)

D. A. MacLaren (), B. Holst, D. J. Riley and W. Allison
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D. A. MacLaren: Cavendish Laboratory, Madingley Road, Cambridge CB3 0HE, UK
B. Holst: Cavendish Laboratory, Madingley Road, Cambridge CB3 0HE, UK
D. J. Riley: Cavendish Laboratory, Madingley Road, Cambridge CB3 0HE, UK
W. Allison: Cavendish Laboratory, Madingley Road, Cambridge CB3 0HE, UK

Surface Review and Letters (SRL), 2003, vol. 10, issue 02n03, 249-255

Abstract: We describe recent developments in the fabrication of an atom-optical mirror for focusing thermal helium atoms. A bent silicon crystal is, in principle, capable of high intensity, low aberration helium reflection; manipulation of the mirror's macrostructure minimizes optical aberrations in the device whilst chemical control over the mirror's microstructure ensures high intensity reflection. Incorporation of the atom mirror into a novel Scanning Helium Microscope (SHeM) is outlined, in the context of surface-structural studies. In particular, we refer to the expected operation, contrast mechanisms and resolution of such an instrument.

Date: 2003
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DOI: 10.1142/S0218625X03005062

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