EFFECT OFBiSURFACTANT IN THE HETEROEPITAXIAL GROWTH OFCoONCuSURFACES

Masao Kamiko (), Hiroaki Chihaya, Wataru Sugimoto, Ryoichi Yamamoto, Sangmun Oh, Junhua Xu and Isao Kojima
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Masao Kamiko: Institute of Industrial Science, University of Tokyo, 4-6-1 Komaba, Meguro-ku, Tokyo 153-8505, Japan
Hiroaki Chihaya: Institute of Industrial Science, University of Tokyo, 4-6-1 Komaba, Meguro-ku, Tokyo 153-8505, Japan
Wataru Sugimoto: Institute of Industrial Science, University of Tokyo, 4-6-1 Komaba, Meguro-ku, Tokyo 153-8505, Japan
Ryoichi Yamamoto: Institute of Industrial Science, University of Tokyo, 4-6-1 Komaba, Meguro-ku, Tokyo 153-8505, Japan
Sangmun Oh: Magnetic Recording System Research Department, Central Research Lab., Hitachi, Ltd., 292 Yoshida-cho, Totsuka-ku, Yokohama 244-0817, Japan
Junhua Xu: Materials Characterization Division, National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology (AIST), AIST Tsukuba Central 5,1-1 Higashi, Tsukuba, Ibaraki 305-8565, Japan
Isao Kojima: Materials Characterization Division, National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology (AIST), AIST Tsukuba Central 5,1-1 Higashi, Tsukuba, Ibaraki 305-8565, Japan

Surface Review and Letters (SRL), 2006, vol. 13, issue 02n03, 201-207

Abstract: We have investigated the effect ofBion the heteroepitaxial growth ofCoonCuby reflection high-energy electron diffraction (RHEED) measurements. It was found thatBienhanced the layer-by-layer growth ofCoon theCu(111)surfaces at 100°C. The dependence of the growth onBilayer thickness suggested that there existed a suitable amount ofBisurfactant layer that enhanced smoother layered growth. On the contrary, for the case ofCogrowth onCu(100),Bidepressed the layer-by-layer growth ofCoonCu(100). The surface segregation effect ofBiwas also studied by Auger electron spectroscopy (AES).

Keywords: Cobalt; thin films; surface segregation; surfactant; MBE; RHEED; AES (search for similar items in EconPapers)
Date: 2006
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DOI: 10.1142/S0218625X06008153

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