STRUCTURAL AND PHOTOLUMINESCENCE PROPERTIES OF POROUS SILICON: EFFECT OF HF CONCENTRATION

B. Natarajan (), V. Ramakrishnan, V. Vasu () and S. Ramamurthy
Additional contact information
B. Natarajan: Department of Physics, SACS MAVMM Engineering College, Madurai 625301, Tamilnadu, India
V. Ramakrishnan: Laser Laboratory, School of Physics, Madurai Kamaraj University, Madurai 625021, Tamilnadu, India
V. Vasu: Department of Physics, Madurai Kamaraj University College, Madurai 625002, Tamilnadu, India
S. Ramamurthy: Department of Physics, Gandhigram Rural Institute, Gandhigram 624302, Tamilnadu, India

Surface Review and Letters (SRL), 2006, vol. 13, issue 04, 351-356

Abstract: Structural and Photoluminescence (PL) studies are carried out for p-type porous silicon materials prepared with different Hydrogen Fluoride (HF) concentration. Surface morphology of porous silicon was analyzed using atomic force microscope (AFM). Fourier Transform Infra Red (FTIR) spectra indicate that surface of porous silicon contain chemical species likeSiHn. PL studies reveal that there is a prominent emission peak around 625 nm. No spectral shift is observed. It is further observed that the emission intensity increases with HF concentration. The PL of the porous silicon layer was found to come from its upper part, which was confirmed by a simulation of the PL spectrum employing an optical model. The refractive indices of the porous silicon layer were also determined through this simulation. The large hydrogen concentration in freshly prepared material has led to the suggestion that a silicon–hydrogen alloy effect is responsible for the luminescence.

Keywords: Structural properties; porous silicon; photoluminescence; HF concentration; 81.05.Rm; 78.55.Mb; 61.43.Gt (search for similar items in EconPapers)
Date: 2006
References: View complete reference list from CitEc
Citations:

Downloads: (external link)
http://www.worldscientific.com/doi/abs/10.1142/S0218625X0600830X
Access to full text is restricted to subscribers

Related works:
This item may be available elsewhere in EconPapers: Search for items with the same title.

Export reference: BibTeX RIS (EndNote, ProCite, RefMan) HTML/Text

Persistent link: https://EconPapers.repec.org/RePEc:wsi:srlxxx:v:13:y:2006:i:04:n:s0218625x0600830x

Ordering information: This journal article can be ordered from

DOI: 10.1142/S0218625X0600830X

Access Statistics for this article

Surface Review and Letters (SRL) is currently edited by S Y Tong

More articles in Surface Review and Letters (SRL) from World Scientific Publishing Co. Pte. Ltd.
Bibliographic data for series maintained by Tai Tone Lim ().