A NEW APPROACH TO PREPARE POLYCRYSTALLINE PbTe–TeO THIN FILM, AND ITS OPTICAL, STRUCTURAL, SURFACE AND ELECTRICAL CHARACTERIZATION

Fatma Meydaneri Tezel and İ. Afşin Kariper
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Fatma Meydaneri Tezel: Department of Metallurgy and Materials Engineering, Faculty of Engineering, Karabük University, Demir-Celik Campus, Balıklarkayası Mevkii, 78050 Karabük, Turkey
İ. Afşin Kariper: #x2020;Department of Science Educations, Faculty of Education, Erciyes University, 38039 Kayseri, Turkey‡Erciyes Teknopark, Building Number 1, No. 41, 38039 Kayseri, Turkey

Surface Review and Letters (SRL), 2021, vol. 28, issue 04, 1-8

Abstract: In this study, PbTe thin film was produced on glass substrates, via chemical bath deposition (CBD) method, with 3-h deposition time at 50∘C. The produced thin film had polycrystalline structure; TeO2, PbTe, PbTe3 and Te2O5 crystals that were characterized by X-ray diffraction (XRD) had tetragonal, cubic, tetragonal and monoclinic crystal structures, respectively. Reflectivity (R; in %), optical transmission (T; in %), optical bandgap (Eg), absorption, dielectric constant (ε), extinction coefficient (k) and refractive index (nr) of polycrystalline PbTe thin film obtained using UV–Vis spectrophotometer were 29.87%, 19.41%, 3.30eV, 0.6, 3.72, 0.05 and 4.08, respectively. Grain sizes of polycrystalline PbTe thin film varied between 8.79nm and 52.55nm. Optical and electrical conductivities of the crystals according to photon energy were calculated using optical parameters, whereas their surface morphology was characterized by scanning electron microscopy (SEM). The thickness of polycrystalline PbTe thin film was measured by atomic force microscopy (AFM), and found to be 900nm.

Keywords: Polycrystalline PbTe–TeO; thin film; CBD method; optical conductivity; electrical conductivity; energy bandgap (search for similar items in EconPapers)
Date: 2021
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DOI: 10.1142/S0218625X21500190

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