PHOTOCATALYTIC DEGRADATION OF BISPHENOL E WITH NANO-SCLAED TiO2 IN AQUEOUS SOLUTION UNDER SOLAR RADIATION

Ahmed H. A. Dabwan (), Tomoki Sugiyama, Ananta Mai Furukawa, Hideyuki Katsumata, Satoshi Kaneco and Ikki Tateishi
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Ahmed H. A. Dabwan: University College TATI, Jalan Panchur, Teluk Kalong, 24000, Kemaman, Terengganu, Malaysia
Tomoki Sugiyama: Department of Chemistry for Materials, Graduate School of Engineering, Mie University, Tsu, Mie 514-8507, Japan
Ananta Mai Furukawa: Department of Chemistry for Materials, Graduate School of Engineering, Mie University, Tsu, Mie 514-8507, Japan
Hideyuki Katsumata: Department of Chemistry for Materials, Graduate School of Engineering, Mie University, Tsu, Mie 514-8507, Japan
Satoshi Kaneco: Department of Chemistry for Materials, Graduate School of Engineering, Mie University, Tsu, Mie 514-8507, Japan
Ikki Tateishi: Global Environment Center for Education & Research, Mie University, Tsu, Mie 514-8507, Japan.

INWASCON Technology Magazine(i-TECH MAG), 2021, vol. 3, 34-40

Abstract: In this work focus was paid to the photocatalytic degradation of Bisphenol E with nano-scaled TiO2 solution under sunlight. Instruments used for characterization and study the removal efficiency were; visible ultraviolet spectrophotometer, SEM (acceleration voltage 25kV) and TEM (acceleration voltage 80kV), X-ray diffraction and BET surface area. Under the optimum conditions; (pH;6, Radiation time; 90 min, Catalyst wt; 0.2g, reaction temperature; 20 oC), complete degradation was obtained. Byproducts from this study could be similar to our previous ones since Bisphenol A and Bisphenol E have very similar structures, hence their decomposition intermediates most probable not to be far. it was found that the decomposition reaction of bisphenol E follows the pseudo-first-order reaction kinetics.

Keywords: Photocatalysts Degradation; Nano Scaled TiO2; Bisphenol E; Endocrine Disruptors; Pseudo-first-order. (search for similar items in EconPapers)
Date: 2021
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Persistent link: https://EconPapers.repec.org/RePEc:zib:zitecm:v:3:y:2021:p:34-40

DOI: 10.26480/itechmag.03.2021.34.40

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