A reliability estimation approach via Wiener degradation model with measurement errors

Donghui Pan, Yantao Wei, Houzhang Fang and Wenzhi Yang

Applied Mathematics and Computation, 2018, vol. 320, issue C, 131-141

Abstract: This paper proposes a reliability estimation approach based on EM algorithm and Wiener processes by considering measurement errors. Firstly, the time-transformed Wiener processes are used to model the degradation process of the product, which simultaneously consider the temporal variability, unit-to-unit heterogeneity and measurement errors. In addition, we obtain the closed-form expressions of some reliability quantities such as reliability function and probability density function of the life. Moreover, the expectation maximization algorithm is adopted to estimate the model parameters effectively. Finally, a numerical example and a practical case study for LED lamps are provided to illustrate the effectiveness and superiority of the presented approach.

Keywords: Expectation maximization; Measurement errors; Reliability; Wiener process (search for similar items in EconPapers)
Date: 2018
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Citations: View citations in EconPapers (10)

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Persistent link: https://EconPapers.repec.org/RePEc:eee:apmaco:v:320:y:2018:i:c:p:131-141

DOI: 10.1016/j.amc.2017.09.020

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