Thermal emissivities of films on substrates

Alok Thakur and Raakesh Raman

Applied Energy, 1983, vol. 15, issue 1, 13 pages

Abstract: An explicit expression for thermal emissivity of thin films has been derived in terms of optical constants of the substrate and film. At millimicron film thicknesses, the substrate plays a vital rôle in governing the emissivities of the films. For low values of the coefficient of absorption, the emissivity has a value of [epsilon]1([lambda]) for zero film thickness, reaches a minimum at an optimum value of thickness and then increases monotonically to [epsilon]2([lambda]) for very large values of thickness. [epsilon]1([lambda]) and [epsilon]2([lambda]) are, respectively, the emissivities of the bulk substrate and the film material. For large values of the coefficient of absorption, the emissivity passes through a minimum and then a maximum before monotonically decreasing to [epsilon]2([lambda]) (for large values of the thickness), as the thickness is increased.

Date: 1983
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