Reliability modeling of uncertain random fractional differential systems with competitive failures
Qinqin Xu and
Yuanguo Zhu
Chaos, Solitons & Fractals, 2022, vol. 162, issue C
Abstract:
Typical degradation-shock failure processes have been widely investigated in current researches, and the failures caused by their dependence are described as competitive failure processes. This paper explores competitive failure modes for uncertain random fractional systems involving degradation and shock processes. We develop a wear degradation model explicitly by employing uncertain fractional differential equations in order to demonstrate the potential heredity and memorability of a system. External shocks are then considered to follow a Poisson process. Based on the classification of shock types, three definitions of reliability index for competitive failures are presented. The reliability index formulas are derived for systems with extreme shock, cumulative shock, and δ shock using chance measures. Finally, we introduce a numerical example where the results of the reliability analysis confirm the validity of proposed reliability evaluation methods.
Keywords: Fractional differential equation; Reliability; Uncertainty; Randomness; Chance theory (search for similar items in EconPapers)
Date: 2022
References: View references in EconPapers View complete reference list from CitEc
Citations:
Downloads: (external link)
http://www.sciencedirect.com/science/article/pii/S0960077922006865
Full text for ScienceDirect subscribers only
Related works:
This item may be available elsewhere in EconPapers: Search for items with the same title.
Export reference: BibTeX
RIS (EndNote, ProCite, RefMan)
HTML/Text
Persistent link: https://EconPapers.repec.org/RePEc:eee:chsofr:v:162:y:2022:i:c:s0960077922006865
DOI: 10.1016/j.chaos.2022.112476
Access Statistics for this article
Chaos, Solitons & Fractals is currently edited by Stefano Boccaletti and Stelios Bekiros
More articles in Chaos, Solitons & Fractals from Elsevier
Bibliographic data for series maintained by Thayer, Thomas R. ().