Multi-parameter estimation in critical quantum metrology

Giovanni Di Fresco, Bernardo Spagnolo, Davide Valenti and Angelo Carollo

Chaos, Solitons & Fractals, 2025, vol. 199, issue P3

Abstract: Quantum metrology leverages the unique properties of quantum systems to enhance parameter estimation beyond classical limits. In this short review, we introduce the core concepts of quantum metrology, with a particular focus on its extension to multi-parameter estimation. We begin by outlining the foundational principles of quantum metrology and explore how quantum criticality can enhance measurement precision — especially near quantum phase transitions, where systems exhibit heightened sensitivity to external perturbations. Next, we consider the framework of multi-parameter quantum critical metrology, in which the simultaneous estimation of multiple parameters near criticality can lead to further improvements in accuracy. Finally, we discuss measurement-induced phase transitions, a phenomenon emerging in the context of continuous quantum measurements that introduces non-Hermitian dynamics and fundamentally alters the system’s behavior. This review provides a concise overview of these key developments and highlights their significance for future progress in quantum sensing technologies.

Keywords: Quantum metrology; Quantum criticality; Quantum phase transitions; Multi-parameter estimation; Measurement-induced phase transition (search for similar items in EconPapers)
Date: 2025
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Persistent link: https://EconPapers.repec.org/RePEc:eee:chsofr:v:199:y:2025:i:p3:s0960077925009269

DOI: 10.1016/j.chaos.2025.116913

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