How to measure patent thickets--A novel approach

Georg von Graevenitz, Stefan Wagner and Dietmar Harhoff ()

Economics Letters, 2011, vol. 111, issue 1, 6-9

Abstract: This paper provides a direct measure of the density of patent thickets based on patent citations. We discuss the algorithm that generates the measure and present descriptive results validating it. Moreover, we identify technology areas particularly affected by patent thickets.

Keywords: Patenting; Patent; thickets; Patent; portfolio; races; Complexity (search for similar items in EconPapers)
Date: 2011
References: View references in EconPapers View complete reference list from CitEc
Citations: View citations in EconPapers (48)

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Working Paper: How to measure patent thickets – a novel approach (2009)
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Persistent link: https://EconPapers.repec.org/RePEc:eee:ecolet:v:111:y:2011:i:1:p:6-9

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