How to measure patent thickets – a novel approach

Georg von Graevenitz, Stefan Wagner and Dietmar Harhoff ()

Discussion Papers in Business Administration from University of Munich, Munich School of Management

Abstract: The existing literature identifies patent thickets indirectly. In this paper we propose a novel measure based on patent citations which allows us to measure the density of patent thickets directly. We discuss the algorithm which generates the measure and present descriptive results validating it. Moreover, we identify technology areas which are particularly impacted by patent thickets.

Keywords: patenting; patent thickets; patent portfolio races; complexity (search for similar items in EconPapers)
JEL-codes: L13 L20 O34 (search for similar items in EconPapers)
Date: 2009-06-15
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Citations: View citations in EconPapers (8)

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Related works:
Journal Article: How to measure patent thickets--A novel approach (2011)
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Persistent link: https://EconPapers.repec.org/RePEc:lmu:msmdpa:10962

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