 Burn-in considering yield loss and reliability gain for integrated circuitsKyungmee O. Kim European Journal of Operational Research, 2011, vol. 212, issue 2, 337-344 Abstract: This paper presents burn-in effects on yield loss and reliability gain for a lifetime distribution developed from a negative binomial defect density distribution and a given defect size distribution, after assuming that the rate of defect growth is proportional to the power of the present defect size. While burn-in always results in yield loss, it creates reliability gain only if either defects grow fast or the field operation time is long. Otherwise, burn-in for a short time could result in reliability loss. The optimal burn-in time for maximizing reliability is finite if defects grow linearly in time and is infinite if defects grow nonlinearly in time. The optimal burn-in time for minimizing cost expressed in terms of both yield and reliability increases in the field operation time initially but becomes constant as the field operation time is long enough. It is numerically shown that increasing mean defect density or defect clustering increases the optimal burn-in time. Keywords: Reliability; Defect; growth; Defect; size; distribution; Negative; binomial; defect; density (search for similar items in EconPapers) Downloads: (external link) Related works: Export reference: BibTeX RIS (EndNote, ProCite, RefMan) HTML/Text Persistent link: https://EconPapers.repec.org/RePEc:eee:ejores:v:212:y:2011:i:2:p:337-344 Access Statistics for this article European Journal of Operational Research is currently edited by Roman Slowinski, Jesus Artalejo, Jean-Charles. Billaut, Robert Dyson and Lorenzo Peccati More articles in European Journal of Operational Research from Elsevier |
Is your work missing from RePEc? Here is how to contribute.
Questions or problems? Check the EconPapers FAQ or send mail to .
EconPapers is hosted by the
School of Business at Örebro University.