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Degradation-based burn-in with preventive maintenance

Zhi-Sheng Ye, Yan Shen and Min Xie

European Journal of Operational Research, 2012, vol. 221, issue 2, 360-367

Abstract: As many products are becoming increasingly more reliable, traditional lifetime-based burn-in approaches that try to fail defective units during the test require a long burn-in duration, and thus are not effective. Therefore, we promote the degradation-based burn-in approach that bases the screening decision on the degradation level of a burnt-in unit. Motivated by the infant mortality faced by many Micro-Electro-Mechanical Systems (MEMSs), this study develops two degradation-based joint burn-in and maintenance models under the age and the block based maintenances, respectively. We assume that the product population comprises a weak and a normal subpopulations. Degradation of the product follows Wiener processes with linear drift, while the weak and the normal subpopulations possess distinct drift parameters. The objective of joint burn-in and maintenance decisions is to minimize the long run average cost per unit time during field use by properly choosing the burn-in settings and the preventive replacement intervals. An example using the MEMS devices demonstrates effectiveness of these two models.

Keywords: Preventive replacement; Burn-in; Long run average cost; Degradation; Wiener process (search for similar items in EconPapers)
Date: 2012
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Citations: View citations in EconPapers (29)

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Persistent link: https://EconPapers.repec.org/RePEc:eee:ejores:v:221:y:2012:i:2:p:360-367

DOI: 10.1016/j.ejor.2012.03.028

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