Stochastic projection methods and applications to some nonlinear inverse problems of phase retrieving

Karl K. Sabelfeld

Mathematics and Computers in Simulation (MATCOM), 2018, vol. 143, issue C, 169-175

Abstract: In this short paper we present a stochastic projection based Monte Carlo algorithm for solving a nonlinear ill-posed inverse problem of recovering the phase of a complex-valued function provided its absolute value is known, under some additional information. The method is developed here for retrieving the step structure of the epitaxial films from the X-ray diffraction analysis. We suggest to extract some additional information from the measurements which makes the problem well-posed, and with this information, the method suggested works well even for noisy measurements. Results of simulations for a layer structure recovering problem with 26 sublayers are presented.

Keywords: Stochastic projections; Inverse problem; X-ray diffraction; Epitaxial layers; Phase retrieving (search for similar items in EconPapers)
Date: 2018
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Persistent link: https://EconPapers.repec.org/RePEc:eee:matcom:v:143:y:2018:i:c:p:169-175

DOI: 10.1016/j.matcom.2016.08.001

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