Application of the simulated annealing local search technique to problems of redundancy elimination in functional and parametric tests of integrated circuits

W. Mergenthaler, B. Mauersberg, J. Feller, L.J. Stuehler, O’Grady, W.T. and J.S. Ledford

Mathematics and Computers in Simulation (MATCOM), 2003, vol. 62, issue 3, 443-451

Abstract: Testing integrated circuits is a costly process. The present article investigates combinatorial optimization problems reducing subsets of tests, which are redundant in a statistical sense. The solution to those problems is brought about by application of the Simulated annealing local search technique, which, in turn makes wide use of random number generation.

Keywords: Redundancy elimination; Integrated circuits; Test cost reduction; Simulated annealing (search for similar items in EconPapers)
Date: 2003
References: View complete reference list from CitEc
Citations:

Downloads: (external link)
http://www.sciencedirect.com/science/article/pii/S0378475402002227
Full text for ScienceDirect subscribers only

Related works:
This item may be available elsewhere in EconPapers: Search for items with the same title.

Export reference: BibTeX RIS (EndNote, ProCite, RefMan) HTML/Text

Persistent link: https://EconPapers.repec.org/RePEc:eee:matcom:v:62:y:2003:i:3:p:443-451

DOI: 10.1016/S0378-4754(02)00222-7

Access Statistics for this article

Mathematics and Computers in Simulation (MATCOM) is currently edited by Robert Beauwens

More articles in Mathematics and Computers in Simulation (MATCOM) from Elsevier
Bibliographic data for series maintained by Catherine Liu ().