Monte Carlo simulation of the transient response of single photon absorption in X-ray pixel detectors

Hans-Erik Nilsson, Ervin Dubaric, Mats Hjelm and Urban Englund

Mathematics and Computers in Simulation (MATCOM), 2003, vol. 62, issue 3, 471-478

Abstract: A Monte Carlo study of the transient response of single photon absorption in X-ray pixel detectors is presented. The simulation results have been combined with Monte Carlo simulation of the X-ray photon transport and absorption, and used to estimate the image properties of a detector system, including the pixel array and readout electronics. The study includes several different simulation challenges, such as full band Monte Carlo simulation of charge transport in large devices (300μm×100μm), modelling of three-dimensional electrostatic effects using cylindrical coordinates, Monte Carlo simulation of photon transport and absorption, and a system level Monte Carlo simulation of the entire pixel detector and readout.

Keywords: Monte Carlo methods; X-ray; Pixel detector; Semiconductor simulation (search for similar items in EconPapers)
Date: 2003
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Citations: View citations in EconPapers (1)

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Persistent link: https://EconPapers.repec.org/RePEc:eee:matcom:v:62:y:2003:i:3:p:471-478

DOI: 10.1016/S0378-4754(02)00242-2

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