Dynamic inverse obstacle problems with electrical impedance tomography

K.Y. Kim, B.S. Kim, M.C. Kim and S. Kim

Mathematics and Computers in Simulation (MATCOM), 2004, vol. 66, issue 4, 399-408

Abstract: Electrical impedance tomography (EIT) is a relatively new imaging modality in which the internal resistivity distribution is reconstructed based on the known sets of injected currents and measured voltages on the surface of the object.

Keywords: Electrical impedance tomography; Extended Kalman filter; Dynamic inverse obstacle problem (search for similar items in EconPapers)
Date: 2004
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Persistent link: https://EconPapers.repec.org/RePEc:eee:matcom:v:66:y:2004:i:4:p:399-408

DOI: 10.1016/j.matcom.2004.02.004

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