Influence of the phase diagram on the diffuse interface thickness and on the microstructure formation in a phase-field model for binary alloy

Michael Selzer, Britta Nestler and Denis Danilov

Mathematics and Computers in Simulation (MATCOM), 2010, vol. 80, issue 7, 1428-1437

Abstract: A phase-field model is used to investigate the responses of planar interfaces and of eutectic microstructures on the different shapes of the phase diagram in binary alloy systems. Numerical solutions of the dynamic field equations show that the interfacial profile and the thickness of the diffuse boundary layer depend on the segregation of the alloy components. The simulations are presented for different openings of binary phase diagrams. A strong influence of the phase diagram on the evolution of eutectic microstructures is found and quantitatively evaluated by defining an appropriate measure. The results are interpreted in terms of weighting the different contributions in the phase-field equation.

Keywords: Phase-field modelling; Diffuse interface; Binary alloys; Microstructure formation (search for similar items in EconPapers)
Date: 2010
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Persistent link: https://EconPapers.repec.org/RePEc:eee:matcom:v:80:y:2010:i:7:p:1428-1437

DOI: 10.1016/j.matcom.2010.01.004

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