Computational procedure of assessing lifetime performance index of Weibull lifetime products with the upper record values

Hsiu-Mei Lee, Wen-Chuan Lee, Chia-Ling Lei and Jong-Wuu Wu

Mathematics and Computers in Simulation (MATCOM), 2011, vol. 81, issue 6, 1177-1189

Abstract: Process capability indices (PCIs) are used to measure process potential and performance. This study constructs an uniformly minimum variance unbiased estimator (UMVUE) of the lifetime performance index based on the upper record values for Weibull lifetime model. Then the UMVUE of the lifetime performance index is utilized to develop the new hypothesis testing procedure in the condition of known lower specification limit. Finally, two examples are presented to assess the behavior of this test statistic for testing null hypothesis under given significance level. Moreover, the product managers can then employ the new testing procedure to determine whether the process adheres to the required level.

Keywords: Process capability indices; Weibull distribution; Upper record values; UMVUE; Data transformation (search for similar items in EconPapers)
Date: 2011
References: View references in EconPapers View complete reference list from CitEc
Citations: View citations in EconPapers (5)

Downloads: (external link)
http://www.sciencedirect.com/science/article/pii/S0378475410003861
Full text for ScienceDirect subscribers only

Related works:
This item may be available elsewhere in EconPapers: Search for items with the same title.

Export reference: BibTeX RIS (EndNote, ProCite, RefMan) HTML/Text

Persistent link: https://EconPapers.repec.org/RePEc:eee:matcom:v:81:y:2011:i:6:p:1177-1189

DOI: 10.1016/j.matcom.2010.11.004

Access Statistics for this article

Mathematics and Computers in Simulation (MATCOM) is currently edited by Robert Beauwens

More articles in Mathematics and Computers in Simulation (MATCOM) from Elsevier
Bibliographic data for series maintained by Catherine Liu ().