An MTO theory for the calculation of deep levels in semiconductors due to a nonsubstitutional impurity cluster
R. Rotthier,
L. Scheire and
P. Phariseau
Physica A: Statistical Mechanics and its Applications, 1981, vol. 108, issue 2, 622-630
Abstract:
In this paper an MTO method is presented to calculate deep levels in semiconductors due to a nonsubstitutional impurity cluster. Through the introduction of this cluster, not only can we allow for charge transfer, but also lattice relaxation is incorporated. In addition, the theory is applicable to the case of an interstitial imperfection.
Date: 1981
References: View complete reference list from CitEc
Citations:
Downloads: (external link)
http://www.sciencedirect.com/science/article/pii/0378437181901576
Full text for ScienceDirect subscribers only. Journal offers the option of making the article available online on Science direct for a fee of $3,000
Related works:
This item may be available elsewhere in EconPapers: Search for items with the same title.
Export reference: BibTeX
RIS (EndNote, ProCite, RefMan)
HTML/Text
Persistent link: https://EconPapers.repec.org/RePEc:eee:phsmap:v:108:y:1981:i:2:p:622-630
DOI: 10.1016/0378-4371(81)90157-6
Access Statistics for this article
Physica A: Statistical Mechanics and its Applications is currently edited by K. A. Dawson, J. O. Indekeu, H.E. Stanley and C. Tsallis
More articles in Physica A: Statistical Mechanics and its Applications from Elsevier
Bibliographic data for series maintained by Catherine Liu ().