Second-order ellipsometric coefficients

John Lekner

Physica A: Statistical Mechanics and its Applications, 1982, vol. 113, issue 3, 506-520

Abstract: We derive analytic expressions for the reflection amplitudes of s and p polarized electromagnetic radiation incident on a planar interface profile of arbitrary form, to second order in the parameter qa, where q is the component of the wavenumber perpendicular to the interface, and a is a length proportional to the interface thickness. New comparison identities, relating the reflection and transmission amplitudes of the p-wave to those for any reference profile, are derived. The second-order results are obtained by using one of these identities, and an integro-differential form of the p-wave equation.

Date: 1982
References: View complete reference list from CitEc
Citations:

Downloads: (external link)
http://www.sciencedirect.com/science/article/pii/0378437182901534
Full text for ScienceDirect subscribers only. Journal offers the option of making the article available online on Science direct for a fee of $3,000

Related works:
This item may be available elsewhere in EconPapers: Search for items with the same title.

Export reference: BibTeX RIS (EndNote, ProCite, RefMan) HTML/Text

Persistent link: https://EconPapers.repec.org/RePEc:eee:phsmap:v:113:y:1982:i:3:p:506-520

DOI: 10.1016/0378-4371(82)90153-4

Access Statistics for this article

Physica A: Statistical Mechanics and its Applications is currently edited by K. A. Dawson, J. O. Indekeu, H.E. Stanley and C. Tsallis

More articles in Physica A: Statistical Mechanics and its Applications from Elsevier
Bibliographic data for series maintained by Catherine Liu ().