Invariant formulation of the reflection of long waves by interfaces

John Lekner

Physica A: Statistical Mechanics and its Applications, 1984, vol. 128, issue 1, 229-252

Abstract: A theory which calculates reflection amplitudes as perturbation series about a reference profile must obtain results for observables which are invariant to the positioning of the reference profile. We construct a manifestly invariant theory for electromagnetic s and p waves, to second order in the ratio of interface thickness to wavelength. The results are expressed in terms of “integral invariants”: combinations of integrals over the difference between the reference and the actual dielectric functions, which are invariant to their relative positioning. To second order in the interface thickness, |rs|2 is characterized by one second order invariant (i2), while |rp|2 and rp/rs are each characterized by a first order invariant (I1) and two second order invariants (i2 and j2).

Date: 1984
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Persistent link: https://EconPapers.repec.org/RePEc:eee:phsmap:v:128:y:1984:i:1:p:229-252

DOI: 10.1016/0378-4371(84)90089-X

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