Synchrotron x-ray studies of liquid-vapor interfaces

J. Als-Nielsen

Physica A: Statistical Mechanics and its Applications, 1986, vol. 140, issue 1, 376-389

Abstract: The density profile ϱ(z) across a liquid-vapor interface may be determined by the reflectivity R(θ) of X-rays at grazing angle incidence θ. The relation between R(θ) and ϱ(z) is discussed, and experimental examples illustrating thermal roughness of simple liquids and smectic layering of liquid crystals are presented.

Date: 1986
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Persistent link: https://EconPapers.repec.org/RePEc:eee:phsmap:v:140:y:1986:i:1:p:376-389

DOI: 10.1016/0378-4371(86)90244-X

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