Percolation-localization crossover in sputtered Pd films

N. Papandreou, P. Nedellec and J. Rosenblatt

Physica A: Statistical Mechanics and its Applications, 1989, vol. 157, issue 1, 171-176

Abstract: Thin Pd films are irradiated with 100 keV Xe ions and their resistance is measured in situ. The rapid increase of the resistance at sufficiently high fluences is attributed to the creation of holes in the sample and confirmed by TEM studies.

Date: 1989
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Persistent link: https://EconPapers.repec.org/RePEc:eee:phsmap:v:157:y:1989:i:1:p:171-176

DOI: 10.1016/0378-4371(89)90295-1

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