Anisotropic percolation and the d-dimensional surface roughening problem

Sergey V. Buldyrev, Shlomo Havlin and H.Eugene Stanley

Physica A: Statistical Mechanics and its Applications, 1993, vol. 200, issue 1, 200-211

Abstract: We review recent numerical simulations of several models of interface growth in d-dimensional media with quenched disorder. These models belong to the universality class of anisotropic diode-resistor percolation networks. The values of the roughness exponent δ=0.63±0.01 (d=1+1) and δ=0.48±0.02 (d=2+1) are in good agreement with our recent experiments. The values of δ in higher dimensions (δ=0.38±0.03 in d=4 and δ=0.27±0.05 in d=5) do not support a recent theoretical conjecture.

Date: 1993
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Persistent link: https://EconPapers.repec.org/RePEc:eee:phsmap:v:200:y:1993:i:1:p:200-211

DOI: 10.1016/0378-4371(93)90518-9

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