Studies of thin smectic C∗ films by X-ray reflectivity

O. Marinov, E. Olbrich, G. Cohen, I. Entin and D. Davidov

Physica A: Statistical Mechanics and its Applications, 1993, vol. 200, issue 1, 730-742

Abstract: The smectic order in thin and ultra thin films (150–600Å) of the chiral ferroelectric liquid crystal mixture ZLI-3654 is studied using the X-ray reflectivity technique. The spin cast films on various substrates (float glass, Si wafer, polymer coated glass, etc.) order spontaneously with smectic layering parallel to the substrate surface. A simple model which assumes a sinusoidal density modulation can describe well the experimental reflectivity profiles. The X-ray reflectivity provides a method to evaluate the phases of the structure factor. We demonstrate, for the first time, that is possible to extract the molecular tilt angle, α, in ferroelectric liquid crystals from X-ray reflectivity measurements of ultra thin films. The temperature dependence of the tilt angle in the smectic C∗ phase are almost independent of the film thickness (down to ∼200 Å) and are similar to those in the bulk.

Date: 1993
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Persistent link: https://EconPapers.repec.org/RePEc:eee:phsmap:v:200:y:1993:i:1:p:730-742

DOI: 10.1016/0378-4371(93)90581-N

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