Phase conjugation and spatial grating formation in amorphous chalcogenide thin films

E. Haro-Poniatowski, M. Fernández-Guasti, S. Camacho-López and F. Ruiz

Physica A: Statistical Mechanics and its Applications, 1994, vol. 207, issue 1, 329-333

Abstract: We present experimental results of phase conjugation (PC) via degenerate four-wave mixing in amorphous Se, Ge10Se90 and Te7Se93 semiconductor thin films. Simultaneously to the PC signal a laser induced grating is formed. However the relief of the grating alone does not seem to explain the experimental results. Measurements of the PC intensity as a function of the film thickness suggest that besides the surface relief, volume effects have to be considered. The PC intensity is measured as a function of the irradiation intensity. The induced gratings are characterized by atomic force microscopy.

Date: 1994
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Persistent link: https://EconPapers.repec.org/RePEc:eee:phsmap:v:207:y:1994:i:1:p:329-333

DOI: 10.1016/0378-4371(94)90391-3

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